<b>Chem 315:<b> Fall 2001

Professor Kenneth S. Suslick        Spring 2008

Course Information, Syllabus, Library List
Lecture Notes
Homework


The lectures are available in Adobe PDF format. Each of these files contains the whole lecture and are 1 to 6 MB in size, so be patient in downloading them.

For students taking Chem 588: I feel strongly that note-taking during lectures is an important part of the learning process because the eye-seeing/hand-writing process is critical to long term memory. I therefore encourage you to take notes thoroughly, even though I make the full lecture notes available.

Each of these files contains the whole lecture and are 0.5 to 4 MB in size, so be patient in downloading them.


Figures and slides herein are used without permission. These lectures are often taken from multiple sources, which have been generally, but not always, cited.

To steal from one source is plagiarism.
To steal from two sources is a term paper.
To steal from three sources is journal article.
To steal from four sources is a thesis.
To steal from five sources is a review.
To steal from six sources is teaching.
— K.S.S.



LECTURES:

Gas Sorption Intro and Surface Area Measurement

Chemisorption

Thermal Analysis: Thermogravimetric Analysis (TGA) and Differential Scanning Calorimetry (DSC)

Thermal Analysis II: Surface Microcalorimetry
Available through the generosity of Professor Charles Campbell (Dept. of Chemistry, U. Washington)

Polymer Characterization and Sizing

Introduction to Electron Microscopy

Electron Optics; Transmission Electron Microscopy (TEM; Sample Preparation

Vacuum Technology

Scanning Electron Microscopy (SEM)

Electron Tomography

Energy Dispersive X-ray Spectroscopy (EDS)

X-ray Photoelectron Spectroscopy (XPS) and Depth Profiling

Auger Electron Spectroscopy (AES)

Electron Energy Loss Spectroscopy (EELS)

Scanning Probe Microscopies:
Scanning Tunnelling Microscopy (STM) & Atomic Force Microscopy (AFM)


Secondary Ion Mass Spectrometry (SIMS), dynamic SIMS (D-SIMS), Time of Flight SIMS (TOF-SIMS)

XRD Powder Patterns

Electron Microdiffraction



STUDENT PRESENTATIONS:
(c)2008, University of Illinois. All rights reserved.

Adam Washburn: Surface Plasmon Resonance Imaging

Eric Brueckner: Current Mapping with AFM

Brad Zeiger: Sonogels

Nicole Honesty: DRIFTS of NOx reduction catalysts

Matt Small: XANES/EXAFS of Nanoparticles

Priya Desai: Wetting Properties of Si

Christine Toh: MALDI of SAMS

En-Chi Lin: MALDI of Polymers

Rachel Castleberry: Focused Beam Reflectance

Sean Sivapalan: AFM of Carbon Nanotubes

Joe Buthker: Force Measurements using AFM

Dennis Butcher: Photocatalytic Nanoparticles

Yuan Gao: Single Molecule Detection with STM

Abe Qavi: Whispering Gallery Modes



Please address any comments or questions to Professor Suslick


© 2008, K.S. Suslick. All right reserved for all lectures and pdf files thereof.